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X Ray Diffractometer

X Ray Diffractometer
X Ray Diffractometer
Product Code : XRD
Price And Quantity
Minimum Order Quantity :
1
Unit of Measure :
Unit/Units
Product Specifications
Technology :
Other
Portable :
No
Light Source :
No
Operating Temperature :
-20+55 Celsius (oC)
Power Source :
Electric
Working Voltage :
220 v
Product Description

Provided X-Ray Diffractometer is highly suitable for verification of one or more phases of unknown specimen. This diffractometer is designed with an integrated quantitative analysis system for known stages of the combined specimen. Moreover, our diffractometer is applicable for crystal structure analysis and change under any condition. Offered X-Ray Diffractometer is ideal for film inspection for various material surface parameters. Along the lines, stress analysis can be performed with our machine in various laboratories and other facilities. This diffractometer is outlined in a compact design to offer higher stability and precision as compared to similar machines available in the market.

XRD - X-Ray Diffractometer is designed for studying material and analyzing industrial product. It is the most suitable product for routine analysis and special purpose measurement.

  • The perfect combination of hardware and software meets the requirements of researchers from different areas;
  • The diffraction angle measurement system with high accuracy provides highly accurate result;
  • The x-ray generator and control system with high stability provides precision test result;
  • Various functional accessories provides users different test purpose;
  • The programmable control that integrated structure design makes operation easy;

XRD X-ray diffractometer is an usual measuring instrument for analyzing the crystal texture and chemical information in materials.

  • Determine one element or multiple elements in unknown samples;
  • Quantitative analysis for mixed sample;
  • Structure analysis in crystal;
  • Test changes in crystal’s structure under unconventional condition;
  • Analyze sample in films including film phase, multilayer film thickness, surface roughness and charge density;
  • Perform micro sample analysis;
  • Perform metal texture and stress analysis.

Technical Reference


RD-2700A

RD-2700B

Rated power

3kw (high frequency and high voltage control technology)

4kw

Tube voltage

10-60kv

Tube current

5-50mA

5-80mA

x-ray Tube

Metal ceramic tube, target material: Cu, Fe, Co., Cr, Mb, power:2.4kw

Focus dimension

1×10mm or 0.4×14mm or 2×12mm

Stability

≤0.005%

≤0.01%

Goniometer Type

Horizontal (θ-θ)

Goniometer Radius

225mm (or be customization, 150-285mm is optional)

2θ measure Range

-6-160°(θs: -3-80°, θd: -3-80°)

Scan speed

0.0012°-50°/min

Minimum step angle

1/10000°

Angle positioning speed

1500°/min

Scan type

θs/θd linkage, single action: continuous, step and omg

Angle repeatability

1/10000°

2θangle linear rate

International standard sample (Si, Al2o3), peak angle tolerance within spectrum range is less than ±0.02°

Detector

PC,SC, SDD high speed one-dimensional semiconductor array detector

Maximum linear rate

5×105CPS (PC, SC is with miss-counting compensation function), 15×104CPS (SDD), 9×107CPS(one dimensional array)

Energy resolution

≤25% (PC, one-dimensional array), ≤50% (SC), ≤200eV (SDD)

Counting type

Integral or differential type, auto PHA, dead time adjustment

System measurement stability

≤0.01%

Scattered ray amount

≤1μSv/h (outside of x-ray protection device)

Instrument stability

≤0.1%

≤0.5%

Instrument dimension

1000×800×1600m


Contact Us

Address: 31-12 Building, Central Avenue, Instrument And Meter Industry Park, New Development Area, Dandong, Liaoning, 118001, China
Phone :86-415-6277566